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Radiation defects and degradation of C-doped SiGe diodes irradiated by electrons

✍ Scribed by K. Takakura; H. Furukawa; S. Kuroki; K. Hayama; T. Kudou; K. Shigaki; H. Ohyama; E. Simoen; G. Eneman; C. Claeys

No coin nor oath required. For personal study only.

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