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Radiation defects and degradation of Si photodiodes irradiated by neutrons at low temperature

✍ Scribed by K. Takakura; K. Hayama; D. Watanabe; H. Ohyama; T. Kudou; K. Shigaki; S. Matsuda; S. Kuboyama; T. Kishikawa; J. Uemura; E. Simoen; C. Claeys

Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 133 KB
Volume: 376-377
Category: Article
ISSN: 0921-4526
DOI: 10.1016/j.physb.2005.12.104

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