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Radiation damage–He interaction in He implanted Si during bubble formation and their evolution in voids

✍ Scribed by V. Raineri; S. Coffa; M. Saggio; F. Frisina; E. Rimini


Book ID
114170580
Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
676 KB
Volume
147
Category
Article
ISSN
0168-583X

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