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Radiation damage of N-MOSFETS fabricated in a BiCMOS process

✍ Scribed by K. Kobayashi; H. Ohyama; M. Yoneoka; K. Hayama; M. Nakabayashi; E. Simoen; C. Claeys; Y. Takami; H. Takizawa; S. Kohiki

No coin nor oath required. For personal study only.

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