Effects of ionizing radiation on n-channel MOSFET's fabricated in zone-melting-recrystallized Si films on SiO2

✍ Scribed by B. Tsaur; J. Fan; G. Turner; D. Silversmith

• Book ID: 126647060
• Publisher: IEEE
• Year: 1982
• Tongue: English
• Weight: 329 KB
• Volume: 3
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/EDL.1982.25535