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Radiation damage in Si photodiodes by high-temperature irradiation

✍ Scribed by H. Ohyama; E. Simoen; C. Claeys; K. Takakura; H. Matsuoka; T. Jono; J. Uemura; T. Kishikawa

Publisher: Elsevier Science
Year: 2003
Tongue: English
Weight: 116 KB
Volume: 16
Category: Article
ISSN: 1386-9477
DOI: 10.1016/s1386-9477(02)00635-5

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