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Radiation damage in Si and GaAs due to low energy ion bombardment: A Al-Bayati, K Orrman-Rossiter, R Baht and D G Armour,Department of Electronic and Electrical Engineering, University of Salford, Salford M5 4WT, UK

Publisher: Elsevier Science
Year: 1989
Tongue: English
Weight: 136 KB
Volume: 39
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(89)91127-5

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