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Quantum modelling of I – V characteristics for 4H–SiC Schottky barrier diodes

✍ Scribed by Blasciuc-Dimitriu, C; Horsfall, A B; Wright, N G; Johnson, C M; Vassilevski, K V; O'Neill, A G


Book ID
120349307
Publisher
Institute of Physics
Year
2004
Tongue
English
Weight
807 KB
Volume
20
Category
Article
ISSN
0268-1242

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Investigation of barrier inhomogeneities
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Using current-voltage measurements, we have investigated the electrical behavior of molybdenum on 4H-SiC Schottky diodes of various areas and having different edge terminations consisting of high resistivity guard rings manufactured by carbon ion-implantation. Both forward and reverse electrical ch