✦ LIBER ✦

Quantum effects on the extraction of MOS oxide traps by 1/f noise measurements

✍ Scribed by Pacelli, A.; Villa, S.; Lacaita, A.L.; Perron, L.M.

Book ID: 114537723
Publisher: IEEE
Year: 1999
Tongue: English
Weight: 221 KB
Volume: 46
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.760413

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Oxide traps characterization of 45 nm MO

Oxide traps characterization of 45 nm MOS transistors by gate current R.T.S. noise measurements

✍ F. Martinez; C. Leyris; G. Neau; M. Valenza; A. Hoffmann; J.C. Vildeuil; E. Vinc 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 247 KB

A characterization of traps in ultrathin-oxide MOSFETs by low frequency noise measurements is presented. Drain and gate current noise measurements are investigated. 1/f drain noise magnitude allows extraction of slow oxide interface trap density. Random Telegraph Signal (R.T.S.) gate noise allows to

Effects of passivation and extraction su

Effects of passivation and extraction surface trap density on the 1/f noise of HgCdTe photoconductive detector

✍ Lin, C.T.; Su, Y.K.; Chang, S.J.; Huang, H.T.; Chang, S.M.; Sun, T.P. 📂 Article 📅 1997 🏛 IEEE 🌐 English ⚖ 83 KB

1/f noise interpretation of the effect o

1/f noise interpretation of the effect of gate oxide nitridation and reoxidation in dielectric traps

✍ Jayaraman, R.; Sodini, C.G. 📂 Article 📅 1990 🏛 IEEE 🌐 English ⚖ 580 KB

Comment, on "A 1/f noise technique to ex

Comment, on "A 1/f noise technique to extract the oxide trap density near the conduction band edge of silicon" [with reply]

✍ Surya, C.; Hsiang, T.Y.; Gross, B.J.; Jayaraman, R.; Sodini, C.G. 📂 Article 📅 1993 🏛 IEEE 🌐 English ⚖ 227 KB

The effects of plasma etching induced ga

The effects of plasma etching induced gate oxide degradation on MOSFET's 1/f noise

✍ Chun Hu; Ji Zhao; G. Li; P. Liu; E. Worley; J. White; R. Kjar 📂 Article 📅 1995 🏛 IEEE 🌐 English ⚖ 315 KB

Effect of the non-gaussianity on the mea

Effect of the non-gaussianity on the measurement error for the filtered 1/f noise intensity

✍ S. V. Makarov; S. Yu. Medvedev; A. V. Yakimov; G. Ferrante; V. Micely; F. Princi 📂 Article 📅 1999 🏛 Springer US 🌐 English ⚖ 632 KB