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Quantum Dot Structures in the InGaAs System Investigated by TEM Techniques

✍ Scribed by P. Werner; K. Scheerschmidt; N.D. Zakharov; R. Hillebrand; M. Grundmann; R. Schneider


Publisher
John Wiley and Sons
Year
2000
Tongue
English
Weight
427 KB
Volume
35
Category
Article
ISSN
0232-1300

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## Abstract The In‐concentration in InGaAs quantum dots located within a GaAs matrix was determined with the composition evaluation by lattice fringe analysis (CELFA) technique. However, the results obtained with this method cannot account for the three‐dimensional shape of quantum dots and their e