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Quantitative x-ray topographic analysis of the defects of 6H-SiC single crystals and homoepitaxial silicon carbide

✍ Scribed by G. F. Kuznetsov


Book ID
110121218
Publisher
Springer
Year
1999
Tongue
English
Weight
400 KB
Volume
44
Category
Article
ISSN
1063-7842

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