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Quantitative surface characterization using X-ray photoelectron spectroscopy

✍ Scribed by David M. Hercules

Book ID: 113022346
Publisher: Springer
Year: 1996
Tongue: English
Weight: 175 KB
Volume: 355
Category: Article
ISSN: 1618-2650
DOI: 10.1007/s0021663550209

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