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Quantitative surface analysis of NbxTa1-x alloys by low-energy ion scattering

✍ Scribed by L.C.A. van den Oetelaar; J.-P. Jacobs; M.J. Mietus; H.H. Brongersma; V.N. Semenov; V.G. Glebovsky


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
477 KB
Volume
70-71
Category
Article
ISSN
0169-4332

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Application of low-energy noble-gas ion
✍ van den Oetelaar, L. C. A.; van Benthem, H. E.; Helwegen, J. H. J. M.; Stapel, P πŸ“‚ Article πŸ“… 1998 πŸ› John Wiley and Sons 🌐 English βš– 488 KB πŸ‘ 2 views

Low-energy noble-gas ion scattering (LEIS) probes the outermost atomic layer of a material, but a quantitative compositional analysis of this layer is not straightforward. It is demonstrated that quantiÐcation by calibration can be done, assuming that ion fractions and shielding e †ects are the same