Combining electron backscatter diffraction (EBSD), a scanning electron microscope (SEM) and a focused ion beam (FIB) together into a single instrument enables three dimensional (3D) characterization of microstructure in crystalline materials. Combining these techniques together has enormous potentia
Quantitative Metallography : Electron Backscatter Diffraction in a FEGSEM
✍ Scribed by Stefan Mitsche; Peter Pölt; Christof Sommitsch
- Publisher
- Wiley (John Wiley & Sons)
- Year
- 2006
- Weight
- 346 KB
- Volume
- 8
- Category
- Article
- ISSN
- 1439-4243
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