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High temperature behavior of Cu films studied in-situ by Electron Backscatter Diffraction

✍ Scribed by K. Mirpuri; H. Wendrock; S. Menzel; K. Wetzig; J. Szpunar

Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 406 KB
Volume: 76
Category: Article
ISSN: 0167-9317
DOI: 10.1016/j.mee.2004.07.044

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