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Quantitative comparison of surface morphology and reflection high-energy electron diffraction intensity for epitaxial growth on GaAs

โœ Scribed by G.R. Bell; T.S. Jones; J.H. Neave; B.A. Joyce


Book ID
117214894
Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
515 KB
Volume
458
Category
Article
ISSN
0039-6028

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