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Reflection high energy electron diffraction measurements of molecular beam epitaxially grown GaAs and InGaAs on GaAs(111)

✍ Scribed by A.M. Dabiran; P.I. Cohen; J.E. Angelo; W.W. Gerberich


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
618 KB
Volume
231
Category
Article
ISSN
0040-6090

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