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Quantitative and Depth-Resolved Investigation of Deep-Level Defects in InGaN/GaN Heterostructures

✍ Scribed by A. Armstrong; M. H. Crawford; D. D. Koleske

Book ID: 107457110
Publisher: Springer US
Year: 2010
Tongue: English
Weight: 316 KB
Volume: 40
Category: Article
ISSN: 0361-5235
DOI: 10.1007/s11664-010-1453-4

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