In order to have available a specimen holder suited to measure the beam current as is often required in quantitative electron probe X-ray microanalysis, the rod of a low background beryllium specimen holder of a transmission electron microscope was modified. The tip was electrically insulated from t
Quantitative Analysis of Thin Specimens in the TEM Using a ?(?z)-Model
β Scribed by Boon, Gerben ;Bastin, Guillaume
- Publisher
- Springer-Verlag
- Year
- 2004
- Weight
- 203 KB
- Volume
- 147
- Category
- Article
- ISSN
- 0344-838X
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