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Quantitative Analysis of Thin Films by dc Arc Optical Emission Spectroscopy

✍ Scribed by Hogrefe, Arnold W.; Lowry, Robert K.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Determination of Carbon by dc Arc Optica

✍ Lowry, Robert K.; Strube, Lois R. 📂 Article 📅 1979 🏛 Society for Applied Spectroscopy 🌐 English ⚖ 174 KB

Direct solid sample analysis of SiC-powd

✍ K. Flórián; W. Fischer; H. Nickel 📂 Article 📅 1994 🏛 Springer 🌐 English ⚖ 196 KB

Depth profile analysis of thin passive f

✍ M. Uemura; T. Yamamoto; K. Fushimi; Y. Aoki; K. Shimizu; H. Habazaki 📂 Article 📅 2009 🏛 Elsevier Science 🌐 English ⚖ 242 KB

Characterization of thin films by optica

✍ E.E. Uzgiris 📂 Article 📅 1973 🏛 Elsevier Science 🌐 English ⚖ 250 KB

Quantitative Determination of Borophosph

✍ Niemczyk, Thomas M.; Zhang, Songbiao; Franke, James E.; Haaland, David M. 📂 Article 📅 1999 🏛 Society for Applied Spectroscopy 🌐 English ⚖ 258 KB

Emission Spectrographic Analysis of Tant

✍ Nohe, J. D. 📂 Article 📅 1967 🏛 Society for Applied Spectroscopy 🌐 English ⚖ 366 KB