𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Quantitative analysis of first and second surface layers by LEIS (TOF)

✍ Scribed by T.M. Buck; G.H. Wheatley; D.P. Jackson

Publisher
Elsevier Science
Year
1983
Weight
575 KB
Volume
218
Category
Article
ISSN
0167-5087

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Quantitative trace metal analysis of sil
Quantitative trace metal analysis of silicon surfaces by ToF-SIMS
✍ Douglas, M. A.; Chen, P. J. πŸ“‚ Article πŸ“… 1998 πŸ› John Wiley and Sons 🌐 English βš– 249 KB πŸ‘ 2 views

Volumetric relative sensitivity factors (RSFs) are determined for 52Cr, 56Fe and 58Ni in an silicon O 2 '-formed oxide using a 12 keV Ga' primary ion beam, and the inΓ‘uence of matrix oxygen content on these RSF values is evaluated. A multivariate expression for RSF values as a function of oxygen con

Quantitative Surface Analysis of Ethylen
Quantitative Surface Analysis of Ethylene-Propylene Polymers using ToF-SIMS
✍ Galuska, Alan A. πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 310 KB πŸ‘ 2 views

Copolymers of ethylene and propylene (EPs) and blends of these copolymers with polypropylene (PP) are commonly used in many elastomer and thermoplastic applications. Ethylene-propylene surface and interfaces have a major e †ect on EP processing and are important in nearly all EP applications. Despit