Quantitative Surface Analysis of Ethylene-Propylene Polymers using ToF-SIMS

✍ Scribed by Galuska, Alan A.

• Publisher: John Wiley and Sons
• Year: 1997
• Tongue: English
• Weight: 310 KB
• Volume: 25
• Category: Article
• ISSN: 0142-2421
• DOI: 10.1002/(sici)1096-9918(199701)25:1<1::aid-sia188>3.0.co;2-r

✦ Synopsis

Copolymers of ethylene and propylene (EPs) and blends of these copolymers with polypropylene (PP) are commonly used in many elastomer and thermoplastic applications. Ethylene-propylene surface and interfaces have a major e †ect on EP processing and are important in nearly all EP applications. Despite the importance of these surfaces and interfaces, there have been no methods for quantitatively determining the ethylene and propylene concentrations on surfaces (top 10-30 or in microscopic phases. In this work, time-of-Ñight secondary ion mass A ) spectrometry (ToF-SIMS) calibrations are developed for quantitative surface analysis of EP polymers. The and intensity variations with EP composition are calibrated to provide quantitative C 3 H 5 '/C 2 H 3 ' C 4 H 7 '/C 2 H 3 ' (»5 wt.% ) ethylene determinations. Moreover, and intensity variations with EP C 5 H 9 '/C 2 H 3 ' C 8 H 13 ' /C 2 H 3 ' composition and sequence distribution provide quantitative (»5 wt.% ) measures of propylene dyads and triads. Both ethylene and sequence distribution calibrations are then modiÐed for micrometer analysis areas. These new capabilities are applied to a case study involving surface migratory polymer on injection-molded sheet and spunbond Ðbers.