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Quantifying neutral base recombination and the effects of collector-base junction traps in UHV/CVD SiGe HBTs

โœ Scribed by Niu, G.; Cressler, J.D.; Joseph, A.J.


Book ID
114537501
Publisher
IEEE
Year
1998
Tongue
English
Weight
157 KB
Volume
45
Category
Article
ISSN
0018-9383

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