Measurement of collector-base junction avalanche multiplication effects in advanced UHV/CVD SiGe HBT's

✍ Scribed by Niu, G.; Cressler, J.D.; Zhang, S.; Gogineni, U.; Ahlgren, D.C.

• Book ID: 114537720
• Publisher: IEEE
• Year: 1999
• Tongue: English
• Weight: 342 KB
• Volume: 46
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.760410