𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Pseudorandom BIST for test and characterization of linear and nonlinear MEMS

✍ Scribed by A. Dhayni; S. Mir; L. Rufer; A. Bounceur; E. Simeu

Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
764 KB
Volume
40
Category
Article
ISSN
0026-2692

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Design, fabrication and testing of a nov
Design, fabrication and testing of a novel MEMS resonator for mass sensing applications
✍ Zachary J. Davis; Winnie Svendsen; Anja Boisen πŸ“‚ Article πŸ“… 2007 πŸ› Elsevier Science 🌐 English βš– 624 KB

Micro-and nanoelectromechanical systems (MEMS/NEMS) have a high potential for mass sensing application. By miniaturization of the dimensions, higher and higher sensitivities can be achieved. Here we are presenting finite element modelling and optimization of a free-free beam type mechanical resonato

A method for characterization of intermo
A method for characterization of intermodulation distortion produced in MEMS switches
✍ D. Girbau; L. Pradell; A. LΓ‘zaro; D. Peyrou; P. Pons; P. Calmon; R. Plana; F. Co πŸ“‚ Article πŸ“… 2009 πŸ› John Wiley and Sons 🌐 English βš– 389 KB

## Abstract This article proposes an alternative method, based on reflection measurements, to characterize intermodulation distortion (IMD) in MEMS switches. Because of the low intermodulation level generated in MEMS switches, its characterization is problematic, requiring high‐power RF tones (high