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Proton migration mechanism for operational instabilities in organic field-effect transistors

✍ Scribed by Sharma, A.; Mathijssen, S. G. J.; Smits, E. C. P.; Kemerink, M.; de Leeuw, D. M.; Bobbert, P. A.

Book ID: 120941196
Publisher: The American Physical Society
Year: 2010
Tongue: English
Weight: 438 KB
Volume: 82
Category: Article
ISSN: 1098-0121
DOI: 10.1103/PhysRevB.82.075322

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