SPIE Proceedings [SPIE SPIE Photonic Devices + Applications - San Diego, California (Sunday 1 August 2010)] Organic Field-Effect Transistors IX - Bias stress effect and recovery in organic field effect transistors: proton migration mechanism

✍ Scribed by Sharma, A.; Mathijssen, Simon G. J.; Kemerink, M.; de Leeuw, Dago M.; Bobbert, Peter A.; Bao, Zhenan; McCulloch, Iain

• Book ID: 121211980
• Publisher: SPIE
• Year: 2010
• Weight: 361 KB
• Volume: 7778
• Category: Article
• DOI: 10.1117/12.859111