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Proton and Heavy-Ion Radiation Damage Studies in MOS Transistors

โœ Scribed by Stapor, W. J.; August, L. S.; Wilson, D. H.; Oldham, T. R.; Murray, K. M.


Book ID
114663208
Publisher
IEEE
Year
1985
Tongue
English
Weight
998 KB
Volume
32
Category
Article
ISSN
0018-9499

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