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Properties of Defect Traps in Triple-Stack InAs/GaAs Quantum Dots and Effect of Annealing

✍ Scribed by Chen, Jenn-Fang; Hsiao, Ru-Shang; Shih, Shen-Hung; Wang, Pai-Yong; Wang, Jyh-Shyang; Chi, Jim Y.

Book ID: 123608423
Publisher: Institute of Pure and Applied Physics
Year: 2004
Tongue: English
Weight: 120 KB
Volume: 43
Category: Article
ISSN: 0021-4922
DOI: 10.1143/JJAP.43.L1150

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