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Properties of Crystalline and Amorphous Silicon Telluride

✍ Scribed by Petersen, Kurt E.; Birkholz, Ulrich; Adler, David


Book ID
118248681
Publisher
The American Physical Society
Year
1973
Tongue
English
Weight
763 KB
Volume
8
Category
Article
ISSN
1098-0121

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Properties of interfaces in amorphous/cr
✍ Olibet, Sara ;Vallat-Sauvain, Evelyne ;Fesquet, Luc ;Monachon, Christian ;Hessle πŸ“‚ Article πŸ“… 2010 πŸ› John Wiley and Sons 🌐 English βš– 852 KB

## Abstract To study recombination at the amorphous/crystalline Si (a‐Si:H/c‐Si) heterointerface, the amphoteric nature of silicon (Si) dangling bonds is taken into account. Modeling interface recombination measured on various test structures provides insight into the microscopic passivation mechan