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Probing nanodefects in fused silica by near-field scanning optical microscopy

✍ Scribed by Wang, Li; Yan, M.; Siekhaus, W.; Oberhelman, S.

Book ID
111654125
Publisher
American Institute of Physics
Year
1998
Tongue
English
Weight
585 KB
Volume
84
Category
Article
ISSN
0021-8979

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Probing photonic and optoelectronic stru
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✍ Renaud Bachelot; Gilles Lerondel; Sylvain Blaize; Sebastien Aubert; Aurelien Bru πŸ“‚ Article πŸ“… 2004 πŸ› John Wiley and Sons 🌐 English βš– 546 KB

## Abstract This report presents the Apertureless Scanning Optical Near‐Field Microscope as a powerful tool for the characterization of modern optoelectronic and photonic components with sub‐wavelength resolution. We present an overview of the results we obtained in our laboratory over the past few