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Probing induced defects in individual carbon nanotubes using electrostatic force microscopy

✍ Scribed by T. Sand Jespersen; J. Nygård


Book ID
106020485
Publisher
Springer
Year
2007
Tongue
English
Weight
335 KB
Volume
88
Category
Article
ISSN
1432-0630

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Electrostatic force microscopy (EFM) was used to localize and characterize conducting nanofillers inside the domains of a block copolymer matrix. The confinement of carbon nanotubes into polystyrene-b-polyisoprene-b-polystyrene block copolymer (SIS) matrix was investigated. The EFM technique provide