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Probe calibration in magnetic force microscopy

✍ Scribed by Goddenhenrich, T.; Lemke, H.; Muck, M.; Hartmann, U.; Heiden, C.

Book ID: 115481132
Publisher: American Institute of Physics
Year: 1990
Tongue: English
Weight: 491 KB
Volume: 57
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.103827

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