Cantilever probes with integrated tips are commercially available. They are routinely used for atomic force microscopy (AFM). For such probes a magnetic refinement of the silicon tip has been developed which results in a deposition of ferromagnetic materials like Nickel or CrCoTa at the top area of
Force microscopy: Magnetic tips probe the nanoworld
β Scribed by Meyer, Ernst; Rast, Simon
- Book ID
- 109941430
- Publisher
- Nature Publishing Group
- Year
- 2007
- Tongue
- English
- Weight
- 135 KB
- Volume
- 2
- Category
- Article
- ISSN
- 1748-3387
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