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Metal-coated carbon nanotube tips for magnetic force microscopy

โœ Scribed by Deng, Zhifeng; Yenilmez, Erhan; Leu, Josh; Hoffman, J. E.; Straver, Eric W. J.; Dai, Hongjie; Moler, Kathryn A.

Book ID
111674240
Publisher
American Institute of Physics
Year
2004
Tongue
English
Weight
565 KB
Volume
85
Category
Article
ISSN
0003-6951

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โœ R. Jumpertz; P. Leinenbach; A.W.A. van der Hart; J. Schelten ๐Ÿ“‚ Article ๐Ÿ“… 1997 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 372 KB

Cantilever probes with integrated tips are commercially available. They are routinely used for atomic force microscopy (AFM). For such probes a magnetic refinement of the silicon tip has been developed which results in a deposition of ferromagnetic materials like Nickel or CrCoTa at the top area of