๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Atomic force microscopy: Getting a feeling for the nanoworld

โœ Scribed by Stark, Robert W.

Book ID
109941491
Publisher
Nature Publishing Group
Year
2007
Tongue
English
Weight
141 KB
Volume
2
Category
Article
ISSN
1748-3387

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Atomic force microscopyโ€”a powerful tool
Atomic force microscopyโ€”a powerful tool for industrial applications
โœ Karbach, A.; Drechsler, D. ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 997 KB

The phenomenal success of atomic force microscopy (AFM) in industry is based on the easy access of samples with practical interest due to the high resolution and high contrast of the method under controllable ambient conditions. In our case, the high resolution of AFM is mainly used in the mesoscale

Atomic force acoustic microscopy for qua
Atomic force acoustic microscopy for quantitative nanomechanical characterization
โœ F. Marinello; P. Schiavuta; S. Vezzรน; A. Patelli; S. Carmignato; E. Savio ๐Ÿ“‚ Article ๐Ÿ“… 2011 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 903 KB

Atomic force acoustic microscopy is an interesting measurement technique for characterization and mapping of local elastic properties of different materials, taking advantage of high lateral resolutions typical of scanning probe instruments. The present work discusses applicability of the technique