The phenomenal success of atomic force microscopy (AFM) in industry is based on the easy access of samples with practical interest due to the high resolution and high contrast of the method under controllable ambient conditions. In our case, the high resolution of AFM is mainly used in the mesoscale
β¦ LIBER β¦
Atomic force microscopy as a tool for atom manipulation
β Scribed by Custance, Oscar; Perez, Ruben; Morita, Seizo
- Book ID
- 109942026
- Publisher
- Nature Publishing Group
- Year
- 2009
- Tongue
- English
- Weight
- 919 KB
- Volume
- 4
- Category
- Article
- ISSN
- 1748-3387
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
Atomic force microscopyβa powerful tool
β
Karbach, A.; Drechsler, D.
π
Article
π
1999
π
John Wiley and Sons
π
English
β 997 KB
Atomic force microscopy as a nanoscience
β
Victor J Morris; Nicola C Woodward; Allan P Gunning
π
Article
π
2011
π
John Wiley and Sons
π
English
β 370 KB
Atomic force microscopy as a tool of ins
β
Evgeniy V. Dubrovin; Yuri-F. Drygin; Viktor K. Novikov; Igor V. Yaminsky
π
Article
π
2007
π
Elsevier Science
π
English
β 604 KB
Here we present a short review of application of atomic force microscopy (AFM) for investigation of viruses, accompanied by examples of high-resolution AFM images of different viral particles. The possibility of using AFM to identify viruses is discussed.
Complex Patterning by Vertical Interchan
β
Sugimoto, Yoshiaki (author);Pou, Pablo (author);Custance, Oscar (author);Jelinek
π
Article
π
2008
π
American Association for the Advancement of Scienc
π
English
β 642 KB
Complex Patterning by Vertical Interchan
β
Sugimoto, Yoshiaki (author);Pou, Pablo (author);Custance, Oscar (author);Jelinek
π
Article
π
2008
π
American Association for the Advancement of Scienc
π
English
β 642 KB
Mechanical distinction and manipulation
β
Seizo Morita; Insook Yi; Yoshiaki Sugimoto; Noriaki Oyabu; Ryuji Nishi; Γscar Cu
π
Article
π
2005
π
Elsevier Science
π
English
β 380 KB