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Force dependences for the definition of the atomic force microscopy spatial resolution

✍ Scribed by Yu.N. Moiseev; V.M. Mostepanenko; V.I. Panov; I.Yu. Sokolov

Publisher: Elsevier Science
Year: 1988
Tongue: English
Weight: 367 KB
Volume: 132
Category: Article
ISSN: 0375-9601
DOI: 10.1016/0375-9601(88)90868-7

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