Force Calibration in Lateral Force Microscopy
β Scribed by Robert G. Cain; Simon Biggs; Neil W. Page
- Book ID
- 102582317
- Publisher
- Elsevier Science
- Year
- 2000
- Tongue
- English
- Weight
- 191 KB
- Volume
- 227
- Category
- Article
- ISSN
- 0021-9797
No coin nor oath required. For personal study only.
β¦ Synopsis
An analysis of the contact mechanics and the forces of interaction in lateral force microscopy measurements is presented. This analysis allows for a new method of interpretation of the frictional forces, the lateral contact stiffness, and the contact shear strength. The technique was developed for the interpretation of frictional data obtained with colloidal probes, although results are presented which illustrate its ability to interpret measurements recorded with both colloidal probes and standard atomic force microscopy tips. The technique is found to compensate for the variations in the contact geometry, giving repeatable results for probes of different sizes. A critical review of other techniques which have been employed to interpret the frictional force in lateral force microscopy is also presented.
π SIMILAR VOLUMES
Conventional friction force microscopy (FFM) is widely used for tribological studies of engineering surfaces. It is, however, difficult to separate friction forces resulting from interactions dependent upon interfacial material properties from surface topography-induced lateral forces. We have devel
By using atomic force microscopy (AFM)/lateral force microscopy (LFM), a comparative study of the topography as well as the tribological properties (at a micrometer scale) of sized E-glass fibers was done. Normal and lateral deflection signals are recorded when an AFM tip scans a fiber surface. Fric