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Improved lateral force calibration based on the angle conversion factor in atomic force microscopy

โœ Scribed by DUKHYUN CHOI; WOONBONG HWANG; EUISUNG YOON


Book ID
108864392
Publisher
John Wiley and Sons
Year
2007
Tongue
English
Weight
681 KB
Volume
228
Category
Article
ISSN
0022-2720

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