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Probabilistic delay fault model for DVFS circuits

✍ Scribed by Lei, Ting; Sun, Yihe; Figueras, Joan


Book ID
114338830
Publisher
Bioline International
Year
2011
Tongue
English
Weight
561 KB
Volume
16
Category
Article
ISSN
1007-0214

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πŸ“œ SIMILAR VOLUMES


Delay fault models for VLSI circuits
✍ Irith Pomeranz; Sudhakar M Reddy πŸ“‚ Article πŸ“… 1998 πŸ› Elsevier Science 🌐 English βš– 218 KB

State-of-the-art technologies for VLSI circuits give rise to various defect mechanisms that may cause a circuit to fail when operated at its designated speed of operation. Such defects are conventionally modeled by delay faults. In this paper, we review delay fault models used for circuits described