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Primary beam address error reduction in E-Beam testing of packaged integrated circuits

✍ Scribed by Jordi Madrenas; Joan Cabestany

Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
580 KB
Volume
24
Category
Article
ISSN
0167-9317

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## Abstract The usual linear shape function for approximating axial displacement in beam finite elements used as eccentric stiffeners leads to an inconsistency which can result in large errors in the deflection of plates or composite beams. The introduction of an additional degree‐of‐freedom for th