✦ LIBER ✦
Noncontact testing of interconnections in film integrated circuits using an electron beam : J. M. Sebeson, D. K. Hindermann, and W. L. Harrod. IEEE 11th Annual Proceedings Reliability Physics 1973, p. 138
- Publisher
- Elsevier Science
- Year
- 1973
- Tongue
- English
- Weight
- 104 KB
- Volume
- 12
- Category
- Article
- ISSN
- 0026-2714
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