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The capacitive coupling error and the capacitive coupling cross talk in electron beam testing of passivated IC and measures for their reduction

✍ Scribed by Wolfgang Mertin; Klaus Dieter Herrmann; Erich Kubalek; Rainer Lackmann; Gerd Weichert; Günther Zimmer


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
538 KB
Volume
12
Category
Article
ISSN
0167-9317

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