Properties of InAs co-doped ZnO thin fil
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J. Elanchezhiyan; B. C. Shin; W. J. Lee; S. H. Park; S. C. Kim
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Article
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2009
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John Wiley and Sons
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English
β 188 KB
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## Abstract InAs coβdoped ZnO films were grown on sapphire substrates by pulsed laser deposition. The grown films have been characterized using Xβray diffraction (XRD), Hall effect measurements, Atomic force microscope (AFM) and Field emission scanning electron microscope (FESEM) in order to invest