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Structural, Optical, and Electrical Characterization of ZnO and Al-doped ZnO Thin Films Deposited by MOCVD

✍ Scribed by Maria Elena Fragalà; Graziella Malandrino; Maria Michela Giangregorio; Maria Losurdo; Giovanni Bruno; Stefano Lettieri; Luigi Santamaria Amato; Pasquale Maddalena

Publisher
John Wiley and Sons
Year
2009
Tongue
English
Weight
476 KB
Volume
15
Category
Article
ISSN
0948-1907

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