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Preparation of polycrystalline SiC films for sensors used at high temperature

โœ Scribed by Toshio Homma; Kiichi Kamimura; Hao Yi Cai; Yoshiharu Onuma

Book ID
108028333
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
323 KB
Volume
40
Category
Article
ISSN
0924-4247

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On the fracture statistics of polycrysta
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โœ A. Charif; F. Osterstock ๐Ÿ“‚ Article ๐Ÿ“… 1992 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 261 KB

Rupture stresses have been measured at room temperature and 1473 K. It is verified how large inclusions, such as large crystals resulting from uncontrolled grain growth, may affect the rupture stress values and their true distribution as described by the Weibull modulus. Owing to their size, these l