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Preparation of polycrystalline Cd1−xInxCr2Se4 thin films

✍ Scribed by M. Lubecka; W. Powrożnik


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
186 KB
Volume
174
Category
Article
ISSN
0040-6090

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Optical Constants of Polycrystalline Cd1
✍ K. Prasada Rao; O. Md. Hussain; B. Srinivasulu Naidu; P. Jayarama Reddy 📂 Article 📅 1997 🏛 John Wiley and Sons 🌐 English ⚖ 127 KB 👁 2 views

Spectroscopic ellipsometry has been used to determine the optical constants-complex dielectric constant (e\* = e 1 + e 2 ), refractive index (n), extinction coefficient (k), absorption coefficient (a) and normal incidence reflectivity (R)-of two-source vacuum-evaporated polycrystalline Cd 1 Àx Zn x