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Spontaneous Ordering in Thin Polycrystalline Cd1–xZnxTe Films during Annealing

✍ Scribed by F. Edelman; S. Stolyarova; A. Chack; N. Zakharov; P. Werner; R. Beserman; R. Weil; Y. Nemirovsky

Publisher
John Wiley and Sons
Year
2002
Tongue
English
Weight
140 KB
Volume
229
Category
Article
ISSN
0370-1972

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Optical Constants of Polycrystalline Cd1
Optical Constants of Polycrystalline Cd1−xZnxTe Thin Films by Spectroscopic Ellipsometry
✍ K. Prasada Rao; O. Md. Hussain; B. Srinivasulu Naidu; P. Jayarama Reddy 📂 Article 📅 1997 🏛 John Wiley and Sons 🌐 English ⚖ 127 KB 👁 2 views

Spectroscopic ellipsometry has been used to determine the optical constants-complex dielectric constant (e\* = e 1 + e 2 ), refractive index (n), extinction coefficient (k), absorption coefficient (a) and normal incidence reflectivity (R)-of two-source vacuum-evaporated polycrystalline Cd 1 Àx Zn x