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Precision Temperature Measurement Using CMOS Substrate PNP Transistors

โœ Scribed by Pertijs, M.A.P.; Meijer, G.C.M.; Huijsing, J.H.


Book ID
121253039
Publisher
IEEE
Year
2004
Tongue
English
Weight
295 KB
Volume
4
Category
Article
ISSN
1530-437X

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โœ Keiko Makie-Fukuda; Takanobu Anbo; Toshiro Tsukada ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 175 KB

It is important to reduce substrate noise in the analog/digital mixed-signal integrated circuits. In order to understand the influence of substrate noise, a technique to measure substrate noise using a chopper-type voltage comparator based on an equivalent sampling method is proposed. The substrate